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    "rossiwu"的相关文件  

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    显示 14 项.

    类别 日期 题名 作者 档案
    [電子工程學系] 期刊論文 2013 Performance tuning of InGaZnO thin-film transistors with a SnInGaZnO
    electron barrier layer    		 吳建宏; rossiwu
    [電子工程學系] 期刊論文 2012 Characterization of Hf1-xZrxO2 Gate Dielectrics with 0 <= x <= 1 Prepared by Atomic Layer Deposition for Metal Oxide Semiconductor Field Effect Transistor Applications 吳建宏; rossiwu
    [電子工程學系] 期刊論文 2012 Improvement on Interface Quality and Reliability Properties of HfAlOx MIS Capacitor with Dual Plasma Treatment 吳建宏; rossiwu
    [電子工程學系] 期刊論文 2012 The effect of oxgen species on the ZnO TFT prepared by atmosphere pressure plasma jet 吳建宏; rossiwu
    [電子工程學系] 期刊論文 2012 The effect of thermal annealing on the properties of IGZO TFT prepared by atmospheric pressure plasma jet 吳建宏; rossiwu
    [電子工程學系] 期刊論文 2012 Characteristics of IGZO TFT Prepared by Atmospheric Pressure Plasma Jet Using PE-ALD Al2O3 Gate Dielectric 吳建宏; rossiwu
    [電子工程學系] 期刊論文 2012 Electrical Improvement of MIS Capacitor with HfAlOx Gate Dielectrics Treated by Dual Plasma Treatment 吳建宏; rossiwu
    [電子工程學系] 期刊論文 2011 Iridium Nanocrystal Thin-Film Transistor Nonvolatile Memory with Si3N4/SiO2 Stack of Asymmetric Tunnel Barrier 吳建宏; rossiwu
    [電子工程學系] 期刊論文 2011 Effects of La2O3 capping layers prepared by different ALD Lanthanum Precursors on Flatband Voltage Tuning and EOT scaling in TiN/HfO2/SiO2/Si MOS structures 吳建宏; rossiwu
    [電子工程學系] 期刊論文 2011 Nickel Nanocrystals Embedded in Metal–Alumina–Nitride–Oxide–Silicon Type Low-Temperature Polycrystalline-Silicon Thin-Film Transistor
    for Low-Voltage Nonvolatile Memory Application    		 吳建宏; rossiwu
    [電子工程學系] 期刊論文 2011 Formation of inverted-pyramid structure by modifying laser processing parameters and acid etching time 吳建宏; rossiwu
    [電子工程學系] 期刊論文 2010 Gate-First TaN/La2O3/SiO2/Ge n-MOSFETs Using Laser Annealing 吳建宏; rossiwu
    [電子工程學系] 期刊論文 2010 Low Driving Voltage Amorphous In-Ga-Zn-O Thin Film Transistors with Small Subthreshold Swing Using High-κ Hf-Si-O Dielectrics 吳建宏; rossiwu
    [電子工程學系] 期刊論文 2009 Defect Density Extraction of high-κ Dielectric Gate Stack by Combining Charge Pumping and Low Frequency Measurement 吳建宏; rossiwu

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