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    請使用永久網址來引用或連結此文件: http://chur.chu.edu.tw/handle/987654321/34825


    題名: Effect of Lid Materials on the Solder Ball Reliability of Thermally Enhanced Flip-Chip Plastic Ball Grid Array Packages
    作者: 簡錫新
    Chien, H. H.
    貢獻者: 機械工程學系
    Mechanical Engineering
    關鍵詞: fatigue life;reliability;thermally enhanced FC-PBGA package;lid;creep
    fatigue life;reliability;thermally enhanced FC-PBGA package;lid;creep
    日期: 2006
    上傳時間: 2014-06-27 03:06:52 (UTC+8)
    摘要: This research studied the thermal fatigue life for eutectic solder balls of thermally enhanced flip-chip plastic ball grid array (FC-PBGA) packages with different lib materials under thermal cycling tests. Three FC-PBGA packages with different lid materia
    This research studied the thermal fatigue life for eutectic solder balls of thermally enhanced flip-chip plastic ball grid array (FC-PBGA) packages with different lib materials under thermal cycling tests. Three FC-PBGA packages with different lid materia
    顯示於類別:[機械工程學系] 期刊論文

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