Chung-Hua University Repository:Item 987654321/34825
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    Please use this identifier to cite or link to this item: http://chur.chu.edu.tw/handle/987654321/34825


    Title: Effect of Lid Materials on the Solder Ball Reliability of Thermally Enhanced Flip-Chip Plastic Ball Grid Array Packages
    Authors: 簡錫新
    Chien, H. H.
    Contributors: 機械工程學系
    Mechanical Engineering
    Keywords: fatigue life;reliability;thermally enhanced FC-PBGA package;lid;creep
    fatigue life;reliability;thermally enhanced FC-PBGA package;lid;creep
    Date: 2006
    Issue Date: 2014-06-27 03:06:52 (UTC+8)
    Abstract: This research studied the thermal fatigue life for eutectic solder balls of thermally enhanced flip-chip plastic ball grid array (FC-PBGA) packages with different lib materials under thermal cycling tests. Three FC-PBGA packages with different lid materia
    This research studied the thermal fatigue life for eutectic solder balls of thermally enhanced flip-chip plastic ball grid array (FC-PBGA) packages with different lib materials under thermal cycling tests. Three FC-PBGA packages with different lid materia
    Appears in Collections:[Department of Mechanical Engineering] Journal Articles

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