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    請使用永久網址來引用或連結此文件: http://chur.chu.edu.tw/handle/987654321/34742


    題名: Experimental and Numerical Investigations on Solder Reliability for Flip-Chip BGA Packaging
    作者: 陳精一
    Chen, Ching-I
    貢獻者: 機械工程學系
    Mechanical Engineering
    關鍵詞: solder reliability;flip-chip BGA package;fatigue life
    solder reliability;flip-chip BGA package;fatigue life
    日期: 2008
    上傳時間: 2014-06-27 03:02:34 (UTC+8)
    摘要: Solder reliability assessments are performed in this
    research using a 3-D equivalent global model and local
    submodeling technique. The equivalent global model is capable of
    addressing cirtical solder failure locations. The local solder ball
    and bump submo
    Solder reliability assessments are performed in this
    research using a 3-D equivalent global model and local
    submodeling technique. The equivalent global model is capable of
    addressing cirtical solder failure locations. The local solder ball
    and bump submo
    顯示於類別:[機械工程學系] 研討會論文

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