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    Please use this identifier to cite or link to this item: http://chur.chu.edu.tw/handle/987654321/34155


    Title: Parametric Assessment for Board-Level Solder Ball Reliability of A HFC-BGA Package
    Authors: 陳精一
    Chen, Ching-I
    Contributors: 機械工程學系
    Mechanical Engineering
    Keywords: board-level reliability;HFC-BGA;finite element analysis
    board-level reliability;HFC-BGA;finite element analysis
    Date: 2006
    Issue Date: 2014-06-27 02:40:55 (UTC+8)
    Abstract: A FC-BGA family package with thermal performance enhancement, denoted the HFC-BGA package, was adopted to
    perform the parametric assessment of board-level package reliability. Solder ball fatigue failure is the major studied
    subject in this research. A 3D
    A FC-BGA family package with thermal performance enhancement, denoted the HFC-BGA package, was adopted to
    perform the parametric assessment of board-level package reliability. Solder ball fatigue failure is the major studied
    subject in this research. A 3D
    Appears in Collections:[Department of Mechanical Engineering] Journal Articles

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