Chung-Hua University Repository:Item 987654321/32084
English  |  正體中文  |  简体中文  |  Items with full text/Total items : 8557/14866 (58%)
Visitors : 2351758      Online Users : 967
RC Version 6.0 © Powered By DSPACE, MIT. Enhanced by NTU Library IR team.
Scope Tips:
  • please add "double quotation mark" for query phrases to get precise results
  • please goto advance search for comprehansive author search
    •  Adv. Search
    Home ‧ Login ‧ Upload ‧ Help ‧ About ‧ Administer Goto mobile version


    Please use this identifier to cite or link to this item: http://chur.chu.edu.tw/handle/987654321/32084


    Title: Nanoscale scratching of platinum thin films using atomic force microscopy with DLC tips
    Authors: 馬廣仁
    Ma, Kung-Jen
    Contributors: 工程科學博士學位學程
    Ph.D. Program in Engineering Science
    Keywords: Atomic force microscope/microscopy;MEMS;Machining;Platinum thin-film;Scratching;Scratch cycle number;Threshold force
    Date: 2012
    Issue Date: 2014-06-27 01:43:53 (UTC+8)
    Abstract: AFM (atomic force microscopy) scratching is a simple yet versatile material removing technique for micro- and nano-patterning. In this article, AFM scratching experiments were conducted to investigate the scratching characteristics of platinum thin-films
    Appears in Collections:[Ph.D.Program in Engineering Science] Journal Articles

    Files in This Item:

    File Description SizeFormat
    p_e318_0006.pdf25KbAdobe PDF354View/Open


    All items in CHUR are protected by copyright, with all rights reserved.

    DSpace Software Copyright © 2002-2004  MIT &  Hewlett-Packard  /   Enhanced by   NTU Library IR team Copyright ©   - Feedback