Empirical Study on the Burn-in Time of SDRAM Products

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Title:	Empirical Study on the Burn-in Time of SDRAM Products
Authors:	楊錦章 YANG, KING JANG
Contributors:	應用統計學系 Applied Statistics
Keywords:	Accelerated Life Testing;burn-in test;reliability test;reliability objective model
Date:	2011
Issue Date:	2014-06-27 10:58:39 (UTC+8)
Abstract:	This study focuses on a burn-in test carried out on SDRAM products for the purpose of obtaining reliability and optimal burn-in time and test costs. The empirical analysis results of this study show that the lifetime of SDRAM products conforms to a Weibul
Appears in Collections:	[Department of Applied Statistics] Journal Articles

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