Chung-Hua University Repository:Item 987654321/34611
English  |  正體中文  |  简体中文  |  Items with full text/Total items : 8557/14866 (58%)
Visitors : 2449775      Online Users : 1137
RC Version 6.0 © Powered By DSPACE, MIT. Enhanced by NTU Library IR team.
Scope Tips:
  • please add "double quotation mark" for query phrases to get precise results
  • please goto advance search for comprehansive author search
  • Adv. Search
    HomeLoginUploadHelpAboutAdminister Goto mobile version


    Please use this identifier to cite or link to this item: http://chur.chu.edu.tw/handle/987654321/34611


    Title: Segmentation of Unevenly Illuminated Line Scanned Images
    Authors: 邱奕契
    Chiou, Yih-Chih
    Contributors: 機械工程學系
    Mechanical Engineering
    Keywords: Line Scanned Image;Flaw Detection;Threshold line;Threshold surface
    Line Scanned Image;Flaw Detection;Threshold line;Threshold surface
    Date: 2008
    Issue Date: 2014-06-27 02:57:12 (UTC+8)
    Abstract: Although many segmentation methods have been published, few are developed especially for line scanned images. A line scanned image tends to have a uniform intensity distribution in column direction while non-uniform intensity distribution in row direction
    Although many segmentation methods have been published, few are developed especially for line scanned images. A line scanned image tends to have a uniform intensity distribution in column direction while non-uniform intensity distribution in row direction
    Appears in Collections:[Department of Mechanical Engineering] Seminar papers

    Files in This Item:

    File Description SizeFormat
    s_M211_0209.pdf26KbAdobe PDF55View/Open


    All items in CHUR are protected by copyright, with all rights reserved.


    DSpace Software Copyright © 2002-2004  MIT &  Hewlett-Packard  /   Enhanced by   NTU Library IR team Copyright ©  2006-2025  - Feedback