Chung-Hua University Repository:Item 987654321/34075
English  |  正體中文  |  简体中文  |  Items with full text/Total items : 8557/14866 (58%)
Visitors : 1417247      Online Users : 1667
RC Version 6.0 © Powered By DSPACE, MIT. Enhanced by NTU Library IR team.
Scope Tips:
  • please add "double quotation mark" for query phrases to get precise results
  • please goto advance search for comprehansive author search
  • Adv. Search
    HomeLoginUploadHelpAboutAdminister Goto mobile version


    Please use this identifier to cite or link to this item: http://chur.chu.edu.tw/handle/987654321/34075


    Title: PRACTICAL EVALUATION FOR LONG-TERM STABILITY OF THERMAL INTERFACE MATERIAL
    Authors: 陳精一
    Chen, Ching-I
    Contributors: 機械工程學系
    Mechanical Engineering
    Keywords: TIM;long-term stability;degradation
    TIM;long-term stability;degradation
    Date: 2009
    Issue Date: 2014-06-27 02:38:50 (UTC+8)
    Abstract: This research proposes a practical evaluation methodology for long-term stability of thermal interface material (TIM). Instead of the ASTM D5470 testing standard, a thermal test vehicle with a sensors and heaters embedded thermal test chip was designed to
    This research proposes a practical evaluation methodology for long-term stability of thermal interface material (TIM). Instead of the ASTM D5470 testing standard, a thermal test vehicle with a sensors and heaters embedded thermal test chip was designed to
    Appears in Collections:[Department of Mechanical Engineering] Journal Articles

    Files in This Item:

    File Description SizeFormat
    p_m211_0113.pdf26KbAdobe PDF62View/Open


    All items in CHUR are protected by copyright, with all rights reserved.


    DSpace Software Copyright © 2002-2004  MIT &  Hewlett-Packard  /   Enhanced by   NTU Library IR team Copyright ©   - Feedback