Application of Computer Vision and Laser Interferometer to the Inspection of Line Scale

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Please use this identifier to cite or link to this item: http://chur.chu.edu.tw/handle/987654321/33938

Title:	Application of Computer Vision and Laser Interferometer to the Inspection of Line Scale
Authors:	羅鵬飛 Luo, Perng-Fei
Contributors:	機械工程學系 Mechanical Engineering
Keywords:	Vision inspection;laser interferometer;outlier-excluding least-squares regression;subpixel edge localization;line-space measurement
Date:	2004
Issue Date:	2014-06-27 02:33:54 (UTC+8)
Abstract:	In the paper machine vision, laser interferometer and coordinate measuring machine (CMM) are combined to develop a vision inspection system. The measurement capability of the developed system is investigated by measuring the distances between the lines on
Appears in Collections:	[Department of Mechanical Engineering] Journal Articles

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