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    Please use this identifier to cite or link to this item: http://chur.chu.edu.tw/handle/987654321/32425


    Title: 設計一個結構化的低密度同位元檢查碼使能有較大周長及改進錯誤率平緩之現象
    Authors: 王俊鑫
    Wang, Chun-Hsin
    Contributors: 資訊工程學系
    Computer Science & Information Engineering
    Keywords: 低密度同位元檢查碼;最小周長;迴圈;碼率
    LDPC codes;girth;short cycle;code rate
    Date: 2011
    Issue Date: 2014-06-27 01:53:54 (UTC+8)
    Abstract: 低密度同位元檢查碼(LDPC codes)近年來已受到各界的矚目,可應用在通訊系統或是資料儲存上,我們提出一個改進後的分割及位移低密度同位元檢查碼的演算法,在固定長度下的低密度同位元檢查碼可以將最小周長放得更大,在固定的最小周長限制下可以減少所需的碼的長度。和 Lu[10] 比較,除了保有原來的優點,可以建構任意的行權重、列權重及最小周長的矩陣外,最大的貢獻為矩陣為了達到的最小周長而放大的倍率比 Lu 的方法還要小很多,因此,隨著碼的長度變小或者放大最小周長,就降低了錯誤率呈平緩的現象。
    LDPC (low-density parity-check) codes have been popular in recent years with its application in communication systems or data storage. In this paper, we present a modified partition-and-shift LDPC code construction algorithm to increase the g
    Appears in Collections:[Department of Computer Science and Information Engineering] Seminar Papers

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